WINDSOR, CT (June 2007) In order to focus on measurement spots, the FISCHERSCOPE® X-RAY measuring instrument records Video images of the specimens. When making measurements on large-area specimens, pc-boards for example, the video image covers only a small portion of the entire specimen due to the necessary magnification. Until now, this complicated the repeated travel to previously recorded measurement spots, their clear identification and renewed measurement. In particular when making measurements on pc-boards, it is often necessary to measure repeatedly at exactly the same spot.
To significantly simplify such measurements, Fischer Technology has introduced a new function in the recently released software version WinFTM® V.6.15 for its X-ray fluorescence measuring instruments, FISCHERSCOPE® X-RAY. It automatically assembles, in a mosaic-like manner, individually recorded video images, which cover only a portion of a large-area specimen, into a complete image that can be stored. The operator can now find once recorded measurement spots with more ease and significantly faster. By positioning the crosshairs with the mouse on the desired location, it is possible to travel repeatedly to any measurement spot.
To generate a complete image of a large-area specimen (or of a partial image which is larger than an individual video image) the operator simply specifies in the instrument the x- and y-coordinates for the corner points of the entire area to be covered. This takes only a short time because the entire image is then scanned in speed mode for this purpose. The WinFTM® V.6.15 software automatically divides the overall area into the individual images to be recorded. It records these images step by step and assembles them to the complete image. This function simplifies and significantly speeds up the measurement and documentation of large-area specimens, such as pc-boards in particular, with regard to the content of harmful substances according to the RoHS Directive.
Fischer has been an innovative leader in the field of non-destructive thickness measurement and material testing instruments since 1953. Solutions are available for coating thickness measurement using the X-Ray fluorescence, beta backscatter, magnetic induction, eddy current and coulometric methods. Fischer also offers solutions for measurement of microhardness, conductivity, ferrite content and porosity testing.
To learn more about all the ways Fischer instruments can overcome your measurement challenges, contact us at
Fischer Technology, Inc.
Phone: (800) 243-8417 FAX: (860) 688-8496
E-mail: info@fischer-technology.com
Web site: www.fischer-technology.com


